New issue
Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.
By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.
Already on GitHub? Sign in to your account
Optimize sparse bitmap operations (set, test and clear) with mostly consecutive values [CORE1070] #1491
Comments
Modified by: @hvladstatus: Open [ 1 ] => Resolved [ 5 ] resolution: Fixed [ 1 ] Fix Version: 2.1 [ 10041 ] |
Modified by: @pcisarstatus: Resolved [ 5 ] => Closed [ 6 ] |
Commented by: @pcisar Reopened to update ticket information. |
Modified by: @pcisarWorkflow: jira [ 11441 ] => Firebird [ 14971 ] |
Modified by: @pavel-zotovQA Status: No test |
Modified by: @pavel-zotovstatus: Closed [ 6 ] => Closed [ 6 ] QA Status: No test => Cannot be tested |
Sign up for free
to join this conversation on GitHub.
Already have an account?
Sign in to comment
Labels
Submitted by: @hvlad
SparseBitmap::set, test and clear spend most it's run time in relatively costly BePlusTree::locate method.
As bunch of bits reside on the same BePlusTree node we can avoid unnecessary call's to BePlusTree::locate when many SparseBitmap operations done with consecutive values. It often happens when we do an index scan as key duplicates now sorted by record numbers
Commits: 2b771cc
The text was updated successfully, but these errors were encountered: